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https://hdl.handle.net/10442/12817
Εξειδίκευση τύπου : | Άρθρο σε επιστημονικό περιοδικό |
Τίτλος: | Aging process of photosensitive chalcogenide films deposited by electron beam deposition |
Δημιουργός/Συγγραφέας: | Charpentier, F. Dussauze, M. Cathelinaud, M. Delaizir, G. [EL] Καμίτσος, Ευστράτιος Ι.[EN] Kamitsos, Efstratios I. Adam, J. -L. Bureau, B. Nazabal, V. |
Εκδότης: | Elsevier Science Sa |
Τόπος έκδοσης: | Lausanne |
Ημερομηνία: | 2011-07-07 |
Γλώσσα: | Αγγλικά |
ISSN: | 0925-8388 |
DOI: | 10.1016/j.jallcom.2011.04.054 |
Περίληψη: | Chalcogenide films attract broad interest due to their use as optical components like narrow band-pass filters, omnidirectional reflectors cladding, all-optical signal processing devices or optochemical sensors. Ge(15)Sb(20)S(65) and As(30)Se(50)Te(20) chalcogenide amorphous films were deposited by electron beam deposition (EBD) using their corresponding bulk glasses as targets. The structure of both bulk and thin film has been studied by far-IR and Raman spectroscopy. This study investigated an ordinary aging behavior of the chalcogenide films by exposing them to natural light under atmospheric conditions for a period of six months. Both films were found to be photosensitive as manifested by the shift of their optical band-gap to shorter or longer wavelength depending on chemical composition. Aging was found to induce also morphological changes, most notably the likely growth of arsenic trioxide microcrystals on the surface of As(30)Se(50)Te(20) films. Such effects were discussed in terms of photo-oxidation and photo-hydrolysis phenomena, the extent of which was found to be relatively limited for Ge(25)Sb(10)S(65) films. The larger stability of the latter films against crystal growth at the surface was associated with the ability of germanium to bond to diffusing oxygen atoms in germanium-oxysulfide tetrahedral arrangements. |
Τίτλος πηγής δημοσίευσης: | Journal of Alloys and Compounds (formerly Known as Journal of the Less Common Metals) |
Τόμος/Κεφάλαιο: | 509 |
Τεύχος: | 27 |
Σελίδες: | 7330-7336 |
Θεματική Κατηγορία: | [EL] Χημεία (Γενικά)[EN] Chemistry (General) [EL] Επιστήμη (Γενικά)[EN] Science (General) [EL] Τεχνολογία (Γενικά)[EN] Technology (General) |
Λέξεις-Κλειδιά: | Thin film Chalcogenide Evaporation Aging Photosensitivity Coating Optical waveguide Chemistry, Physical Materials Science, Multidisciplinary Metallurgy & Metallurgical Engineering |
Αξιολόγηση από ομότιμους (peer reviewed): | Ναι |
Κάτοχος πνευματικών δικαιωμάτων: | © 2011 Elsevier B.V. All rights reserved. |
Ηλεκτρονική διεύθυνση περιοδικού (link) : | http://www.sciencedirect.com/science/journal/09258388 |
Εμφανίζεται στις συλλογές: | Ινστιτούτο Θεωρητικής και Φυσικής Χημείας (ΙΘΦΧ) - Επιστημονικό έργο
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