Εξειδίκευση τύπου :	Άρθρο σε επιστημονικό περιοδικό
Τίτλος:	Surface profile gradient in amorphous Ta 2 O 5 semi conductive layers regulates nanoscale electric current stability
Δημιουργός/Συγγραφέας:	[EL] Κεφαλάς, Αλκιβιάδης Κωνσταντίνος[EN] Cefalas, Alciviadis Constantinos [EL] Κόλλια, Ζωή[EN] Kollia, Zoe Spyropoulos-Antonakakis N. Gavriil V. Christofilos D. Kourouklis G. Semashko V.V. Pavlov V. [EL] Σαραντοπούλου, Ευαγγελία[EN] Sarantopoulou, Evangelia
Εκδότης:	Elsevier B.V.
Ημερομηνία:	2017
Γλώσσα:	Αγγλικά
ISSN:	0169-4332
DOI:	10.1016/j.apsusc.2016.11.076
Περίληψη:	A link between the morphological characteristics and the electric properties of amorphous layers is established by means of atomic, conductive, electrostatic force and thermal scanning microscopy. Using amorphous Ta 2 O 5 (a-Ta 2 O 5 ) semiconductive layer, it is found that surface profile gradients (morphological gradient), are highly correlated to both the electron energy gradient of trapped electrons in interactive Coulombic sites and the thermal gradient along conductive paths and thus thermal and electric properties are correlated with surface morphology at the nanoscale. Furthermore, morphological and electron energy gradients along opposite conductive paths of electrons intrinsically impose a current stability anisotropy. For either long conductive paths (L > 1 μm) or along symmetric nanodomains, current stability for both positive and negative currents i is demonstrated. On the contrary, for short conductive paths along non-symmetric nanodomains, the set of independent variables (L, i) is spanned by two current stability/intability loci. One locus specifies a stable state for negative currents, while the other locus also describes a stable state for positive currents.
Τίτλος πηγής δημοσίευσης:	Applied Surface Science
Τόμος/Κεφάλαιο:	396
Σελίδες:	1000-1019
Θεματική Κατηγορία:	[EL] Φυσική και θεωρητική χημεία[EN] Physical and theoretical chemistry [EL] Εφαρμοσμένη οπτική. Φωτονική[EN] Applied optics. Photonics
Λέξεις-Κλειδιά:	Amorphous semiconductors Conductive atomic force microscopy Current stability Electrostatic force microscopy Scanning thermal microscopy Surface morphology and electric properties of Ta 2 O 5
Αξιολόγηση από ομότιμους (peer reviewed):	Ναι
Κάτοχος πνευματικών δικαιωμάτων:	© 2016 The Author(s)
Όροι και προϋποθέσεις δικαιωμάτων:	All Open Access, Hybrid Gold
Εμφανίζεται στις συλλογές:	Ινστιτούτο Θεωρητικής και Φυσικής Χημείας (ΙΘΦΧ) - Επιστημονικό έργο