Εξειδίκευση τύπου :	Άρθρο σε επιστημονικό περιοδικό
Τίτλος:	Microwave resonant technique in studies of photodielectric properties of bulk, thin film and nanoparticle materials
Δημιουργός/Συγγραφέας:	Pavlov V.V. Rakhmatullin R.M. [EL] Κεφαλάς, Αλκιβιάδης Κωνσταντίνος[EN] Cefalas, Alciviadis Constantinos Semashko V.V.
Εκδότης:	Institute of Physics Publishing
Ημερομηνία:	2016
Γλώσσα:	Αγγλικά
ISSN:	0957-0233
DOI:	10.1088/0957-0233/27/6/065004
Περίληψη:	An enhanced contactless microwave technique allows us to study the photoconductivity of materials. The transient response of the complex permittivity of matter (ϵ = ϵ1 - jϵ 2) under optical irradiation is measured with nanosecond time resolution. The main advantage of the novel methodology is the elimination of the polarization effect in evaluating photoconductivity. The potential of the methodology was demonstrated by photoconductivity measurements in Si [1 0 0] crystal, CeO2 nanocrystalline powder and Ce-doped LiYF4 single crystal. The variations of complex permittivity (δϵ1 and δϵ 2) of Si [1 0 0] crystal, CeO2 nanocrystalline powder and Ce-doped LiYF4 single crystal under optical irradiation was measured and accurate values for crystalline band gaps were extracted. Finally, quantum confinement effects were observed in nano-size crystalline powders.
Τίτλος πηγής δημοσίευσης:	Measurement Science and Technology
Τόμος/Κεφάλαιο:	27
Τεύχος:	6
Θεματική Κατηγορία:	[EL] Φυσική και θεωρητική χημεία[EN] Physical and theoretical chemistry [EL] Εφαρμοσμένη οπτική. Φωτονική[EN] Applied optics. Photonics
Λέξεις-Κλειδιά:	microwave resonant technique photoconductivity measurements polarization effect
Αξιολόγηση από ομότιμους (peer reviewed):	Ναι
Κάτοχος πνευματικών δικαιωμάτων:	© 2016 IOP Publishing Ltd Printed in the UK.
Εμφανίζεται στις συλλογές:	Ινστιτούτο Θεωρητικής και Φυσικής Χημείας (ΙΘΦΧ) - Επιστημονικό έργο