Παρακαλώ χρησιμοποιήστε αυτό το αναγνωριστικό για να παραπέμψετε ή να δημιουργήσετε σύνδεσμο προς αυτό το τεκμήριο:
https://hdl.handle.net/10442/18742
Εξειδίκευση τύπου : | Άρθρο σε επιστημονικό περιοδικό |
Τίτλος: | Refractive index measurement of IP-S and IP-Dip photoresists at THz frequencies and validation via 3D photonic metamaterials made by direct laser writing |
Δημιουργός/Συγγραφέας: | Mavrona, Elena Theodosi, Anna Mackosz, Krzysztof Perivolari, Eleni Utke, Ivo Michler, Johann Schwiedrzik, Jakob Kafesaki, Maria [EL] Τσιλιπάκος Οδυσσέας[EN] Tsilipakos, Odysseas Xomalis, Angelos |
Ημερομηνία: | 2023 |
Γλώσσα: | Αγγλικά |
ISSN: | 2159-3930 |
DOI: | 10.1364/OME.500287 |
Περίληψη: | Direct laser writing (DLW) is widely used to fabricate complex metamaterials (MMs) and photonic devices for nanoscale applications across the electromagnetic frequency spectrum. While the optical properties of conventional photoresists used in DLW are well studied in the visible and infrared range, it is still unclear how they behave at lower frequencies. Here, we measure the refractive index and absorption of IP-S and IP-Dip photoresists within the THz range of the electromagnetic spectrum. Further, we utilize THz time-domain spectroscopy (THz-TDS) to experimentally measure the laser-processed three-dimensional (3D) MM structures. We conduct full-wave electromagnetic simulations using the measured refractive index values to validate our experiments. The THz-TDS measurements are in excellent agreement with the theoretical predictions verifying the validity of our refractive index measurements. This study aims to support and lead future investigations utilizing standard DLW photoresists for photonic applications in the THz range. |
Τίτλος πηγής δημοσίευσης: | Optical Materials Express |
Τόμος/Κεφάλαιο: | 13 |
Τεύχος: | 11 |
Σελίδες: | 3355-3364 |
Θεματική Κατηγορία: | [EL] Οπτική. Φώς[EN] Optics. Light [EL] Φασματοσκοπία[EN] Spectroscopy [EL] Νανοτεχνολογία[EN] Nanotechnology |
Λέξεις-Κλειδιά: | 3D metamaterials Direct laser writing (DLW) Atomic-layered deposition (ALD) Photonic applications THz Photonics |
Όροι και προϋποθέσεις δικαιωμάτων: | Published by Optica Publishing Group under the terms of the Creative Commons Attribution 4.0 License.
Further distribution of this work must maintain attribution to the author(s) and the published article’s title,
journal citation, and DOI. |
Ηλεκτρονική διεύθυνση στον εκδότη (link): | https://opg.optica.org/ome/fulltext.cfm?uri=ome-13-11-3355&id=541256 |
Σημειώσεις: | Published by Optica Publishing Group under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI. |
Εμφανίζεται στις συλλογές: | Ινστιτούτο Θεωρητικής και Φυσικής Χημείας (ΙΘΦΧ) - Επιστημονικό έργο
|